After a thorough investigation, this paper introduces a novel and simple radiofrequency material characterization technique. For this study's purposes, two probes were developed and separated by the sample under test (SUT) with an inhomogeneous test cell. Furthermore, the discontinuity impacts at the probe, SUT interfaces, were also studied. The investigation uses the transmission process through the principle of two different SUT thicknesses to measure its relative permittivity and loss tangent. The technique is based on using the lumped elements of an equivalent circuit of the entire test cell and covers 1 MHz-2 GHz. With the SUT, placed between two metal probes and another metallization, placed under its thickness on an opposite side to improve the loss tangent acquisition level, the cascading chain matrix (CCM) is used to get the final parameters. The thickness changing makes it possible to overcome the contact interface effects probe-sample. A mathematical model has also been presented through the fitting procedure. The new technique has been validated with three materials: Rogers RO4003C, FR-4 HTG-175, and Alumina 99.6%. The SUT complex relative permittivity extraction makes the new approach suitable for the telecommunication industry and many others. The method is also ideal for materials with thickness sizing up to 3 mm around.
2. Takach, A. A., F. M. Mbango, F. Ndagijimana, M. Al-Husseini, and J. Jomaah, "Two-line technique for dielectric material characterization with application in 3D-printing filament electrical parameters extraction," Progress In Electromagnetics Research M, Vol. 85, 195-207, 2019.
3. Lountala, M. G., F. M. Mbango, F. Ndagijimana, and D. Lilonga-Boyenga, "Movable short-circuit technique to extract the relative permittivity of materials from a coaxial cell," Journal of Measurements in Engineering, Vol. 7, 183-194, 2019.
4. Tiwari, N. K. and M. J. Akhtar, "Partially filled substrate integrated waveguide-based microwave technique for broadband dielectric characterization," IEEE Transactions on Instrumentation and Measurement, Vol. 68, 2907-2915, 2019.
5. Tosaka, T., K. Fujii, K. Fukunaga, and A. Kasamatsu, "Development of complex relative permittivity measurement system based on free-space in 220–330-GHz range," IEEE Transactions on Terahertz Science and Technology, Vol. 5, 102-109, 2015.
6. Severo, S. L. S., A. A. A. De Salles, B. Nervis, and B. K. Zanini, "Non-resonant permittivity measurement methods," Journal of Microwaves, Optoelectronics and Electromagnetic Applications, Vol. 16, 297-311, 2017.
7. Materials, L., J. Baker-jarvis, R. G. Geyer, J. H. Grosvenor, M. D. Janezic, C. A. Jones, B. Riddle, and C. M. Weil, "Dielectric characterization of low-loss materials," IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 5, 571-577, 1998.
8. Moukanda Mbango, F., J. E. D. M’Pemba, F. Ndagijimana, and B. M’Passi-Mabiala, "Use of two open-terminated coaxial transmission-lines technique to extract the material relative intrinsic parameters," IEEE Access, Vol. 8, 138682-138689, 2020.
9. You, K. Y., "Effects of sample thickness for dielectric measurements using transmission phase-shift method," International Journal of Advances in Microwave Technology (IJAMT), Vol. 1, 64-67, 2016.
10. Jebbor, N., S. Bri, and M. C. ElBoubakraoui, "Effective complex permittivity determination and microwave absorption properties of a granular dielectric composite material," Procedia Computer Science, Vol. 151, 1022-1027, 2019.
11. Costa, F., M. Borgese, M. Degiorgi, and A. Monorchio, "Electromagnetic characterisation of materials by using Transmission/Reflection (T/R) devices," Electronics (Switzerland), Vol. 6, 2017.
12. Goncalves, F. J. F., A. G. M. Pinto, R. C. Mesquita, E. J. Silva, and A. Brancaccio, "Free-space materials characterization by reflection and transmission measurements using frequency-by-frequency and multi-frequency algorithms," Electronics, Vol. 7, 3-6, 2018.
13. Bronckers, L. A. and A. B. Smolders, "Broadband material characterization method using a CPW with a novel calibration technique," IEEE Antennas and Wireless Propagation Letters, Vol. 15, 1763-1766, 2016.
14. Liao, X. and T. S. Wiedmann, "Characterization of pharmaceutical solids by scanning probe microscopy," Journal of Pharmaceutical Sciences, Vol. 93, 2250-2258, 2004.
15. Pometcu, L., A. Sharaiha, R. Benzerga, R. D. Tamas, and P. Pouliguen, "Method for material characterization in a non-anechoic environment," Applied Physics Letters, Vol. 108, 2-6, 2016.
16. Hyde, M. W., J. W. Stewart, M. J. Havrilla, W. P. Baker, E. J. Rothwell, and D. P. Nyquist, "Nondestructive electromagnetic material characterization using a dual waveguide probe: A full wave solution," Radio Science, Vol. 44, 1-13, 2009.
17. Antosiewicz, T. J., P. Wrobel, and T. Szoplik, "Magnetic probe for material characterization at optical frequencies," Metamaterials VI, Vol. 8070, 80700E, 2011.
18. Campos, D. C., J. C. A. Santos, and L. E. P. Borges, "Investigation of thermal effects in coaxial probe method and dielectric characterization of glycerol up to 140◦C," Journal of Microwaves, Optoelectronics and Electromagnetic Applications, Vol. 18, 1-17, 2019.
19. Liu, W., H. Sun, and L. Xu, "A microwave method for dielectric characterization measurement of small liquids using a metamaterial-based sensor," Sensors (Switzerland), Vol. 18, 18-27, 2018.
20. Bao, X., S. Liu, I. Ocket, J. Bao, D. Schreurs, S. Zhang, C. Cheng, K. Feng, and B. Nauwelaers, "A general line-line method for dielectric material characterization using conductors with the same cross-sectional geometry," IEEE Microwave and Wireless Components Letters, Vol. 28, 356-358, 2018.
21. Lopez-Rodrıguez, P., D. Escot-Bocanegra, D. Poyatos-Martınez, and F. Weinmann, "Comparison of metal-backed free-space and open-ended coaxial probe techniques for the dielectric characterization of aeronautical composites," Sensors, Vol. 16, 967-981, 2016.
22. Reynoso-Hernandez, J. A., "Unified method for determining the complex propagation constant of reflecting and nonreflecting transmission lines," IEEE Microwave and Wireless Components Letters, Vol. 13, 351-353, 2003.
23. Lin, X. and B. C. Seet, "Dielectric characterization at millimeter waves with hybrid microstrip-line method," IEEE Transactions on Instrumentation and Measurement, Vol. 66, 3100-3102, 2017.
24. Ouslimani, H. H., R. Abdeddaim, and A. Priou, "Free-space electromagnetic characterization of materials for microwave and radar applications," PIERS Proceedings, 128-132, Hangzhou, China, 2005.
25. Moukanda Mbango, F. and F. Ndagijimana, "Electric parameter extractions using a broadband technique from coaxial line discontinuities," International Journal of Scientific Research and Management, Vol. 7, 248-253, 2019.