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PIER PIER B PIER C PIER M PIER Letters
2007-12-17
Numerical Modeling of Active Devices Characterized by Measured S-Parameters in FDTD
By
Dao Yi Su,

    Dr. Dao Yi Su

    Xidian University

    China

    Homepage

De-Min Fu,

    Dr. De-Min Fu

    Xidian University

    China

    Homepage

Zhi-Hui Chen

    Dr. Zhi-Hui Chen

    School of Electronic Engineering

    Xidian University

    China

    Homepage

Progress In Electromagnetics Research, Vol. 80, 381-392, 2008
doi:10.2528/PIER07120902
Abstract
A new FDTD modeling approach for active devices characterized by measured S-parameters is presented. This approach applies vector fitting technique and piecewise linear recursive convolution (PLRC) technique to complete modeling process, and does not need to know the equivalent circuits of active devices. It preserves the explicit nature of the traditional FDTD method, and a general updated formula is derived. Furthermore, the main data-processing procedure is directly handled over the frequency band of interest, which avoids the time-domain non-causal error in traditional techniques.
Citation
Dao Yi Su, De-Min Fu, and Zhi-Hui Chen, "Numerical Modeling of Active Devices Characterized by Measured S-Parameters in FDTD," Progress In Electromagnetics Research, Vol. 80, 381-392, 2008.
doi:10.2528/PIER07120902
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