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2023-01-07
Statistics of Two Indicators for Multilook Scattering Signals from Multilayered Structures with Slightly Rough Interfaces
By
Progress In Electromagnetics Research M, Vol. 115, 11-20, 2023
Abstract
Within the framework of the first-order small perturbation method, we derive the statistics of the layered rough surface index and the normalized difference polarization index for three-dimensional layered structure with slightly rough interfaces illuminated by a monochromatic plane wave and for multilook returns. We establish closed-form expressions for the probability density function and the cumulative distribution function. The first- and second-order moments are given by relation recurrences. We validate from Monte Carlo simulations the obtained theoretical formulas.
Citation
Richard Dusséaux, and Saddek Afifi, "Statistics of Two Indicators for Multilook Scattering Signals from Multilayered Structures with Slightly Rough Interfaces," Progress In Electromagnetics Research M, Vol. 115, 11-20, 2023.
doi:10.2528/PIERM22092006
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