Vol. 45
Latest Volume
All Volumes
PIERL 123 [2025] PIERL 122 [2024] PIERL 121 [2024] PIERL 120 [2024] PIERL 119 [2024] PIERL 118 [2024] PIERL 117 [2024] PIERL 116 [2024] PIERL 115 [2024] PIERL 114 [2023] PIERL 113 [2023] PIERL 112 [2023] PIERL 111 [2023] PIERL 110 [2023] PIERL 109 [2023] PIERL 108 [2023] PIERL 107 [2022] PIERL 106 [2022] PIERL 105 [2022] PIERL 104 [2022] PIERL 103 [2022] PIERL 102 [2022] PIERL 101 [2021] PIERL 100 [2021] PIERL 99 [2021] PIERL 98 [2021] PIERL 97 [2021] PIERL 96 [2021] PIERL 95 [2021] PIERL 94 [2020] PIERL 93 [2020] PIERL 92 [2020] PIERL 91 [2020] PIERL 90 [2020] PIERL 89 [2020] PIERL 88 [2020] PIERL 87 [2019] PIERL 86 [2019] PIERL 85 [2019] PIERL 84 [2019] PIERL 83 [2019] PIERL 82 [2019] PIERL 81 [2019] PIERL 80 [2018] PIERL 79 [2018] PIERL 78 [2018] PIERL 77 [2018] PIERL 76 [2018] PIERL 75 [2018] PIERL 74 [2018] PIERL 73 [2018] PIERL 72 [2018] PIERL 71 [2017] PIERL 70 [2017] PIERL 69 [2017] PIERL 68 [2017] PIERL 67 [2017] PIERL 66 [2017] PIERL 65 [2017] PIERL 64 [2016] PIERL 63 [2016] PIERL 62 [2016] PIERL 61 [2016] PIERL 60 [2016] PIERL 59 [2016] PIERL 58 [2016] PIERL 57 [2015] PIERL 56 [2015] PIERL 55 [2015] PIERL 54 [2015] PIERL 53 [2015] PIERL 52 [2015] PIERL 51 [2015] PIERL 50 [2014] PIERL 49 [2014] PIERL 48 [2014] PIERL 47 [2014] PIERL 46 [2014] PIERL 45 [2014] PIERL 44 [2014] PIERL 43 [2013] PIERL 42 [2013] PIERL 41 [2013] PIERL 40 [2013] PIERL 39 [2013] PIERL 38 [2013] PIERL 37 [2013] PIERL 36 [2013] PIERL 35 [2012] PIERL 34 [2012] PIERL 33 [2012] PIERL 32 [2012] PIERL 31 [2012] PIERL 30 [2012] PIERL 29 [2012] PIERL 28 [2012] PIERL 27 [2011] PIERL 26 [2011] PIERL 25 [2011] PIERL 24 [2011] PIERL 23 [2011] PIERL 22 [2011] PIERL 21 [2011] PIERL 20 [2011] PIERL 19 [2010] PIERL 18 [2010] PIERL 17 [2010] PIERL 16 [2010] PIERL 15 [2010] PIERL 14 [2010] PIERL 13 [2010] PIERL 12 [2009] PIERL 11 [2009] PIERL 10 [2009] PIERL 9 [2009] PIERL 8 [2009] PIERL 7 [2009] PIERL 6 [2009] PIERL 5 [2008] PIERL 4 [2008] PIERL 3 [2008] PIERL 2 [2008] PIERL 1 [2008]
2014-04-15
The Frequency Behaviour of the Intrinsic Immunity of the on-Chip Transistor Circuit
By
Progress In Electromagnetics Research Letters, Vol. 45, 111-114, 2014
Abstract
To extract the immunity model in an easy way and to complete the immunity simulation in a short time, it is preferred to consider only the disturbance propagation network in an integrated circuit system. However, through theoretical analyses, simulations and measurements, this paper shows that the on-chip transistor circuit has a nonuniform frequency response on its immunity against arrival disturbances. Including the nonuniform frequency response qualitatively improves the match between the simulation and measurement results. The conclusion is that both the disturbance propagation network and on-chip transistor circuit should be considered in the immunity simulation.
Citation
Tao Su, Hanyu Zheng, Yehua Yang, and Zixin Wang, "The Frequency Behaviour of the Intrinsic Immunity of the on-Chip Transistor Circuit," Progress In Electromagnetics Research Letters, Vol. 45, 111-114, 2014.
doi:10.2528/PIERL14032204
References

1., IEC 62433-4, "Models of integrated circuits for EMI behavioural simulation, conducted immunity modelling,", IEC Standard, 2012.

2. Baffreau, S. and E. Sicard, "On the modelling of microcontrollers immunity to radio frequency interference," EMC Compo, 119-122, Angers, France, 2004.

3. Ichikawa, K., M. Inagaki, Y. Sakurai, I. Iwase, M. Nagata, and O. Wada, "Simulation of integrated circuit immunity with LECCS model," EMC Zurich, 308-311, Singapore, 2006.

4. Boyer, A., S. Bendhia, and E. Sicard, "Modelling of a direct power injection aggression on a 16 bit microcontroller input buffer," EMC Compo, 35-39, Turin, Italy, 2007.
doi:10.1049/el.2010.1571

5. Wan, F., F. Duval, H. Cao, X. Savatier, A. Louis, and B. Mazari, "Increase of immunity of microcontroller to conducted continuous-wave interference by detection method," Electronics Letters, Vol. 46, No. 16, 1113-1114, 2010.
doi:10.1016/j.microrel.2011.07.053

6. Gros, J., G. Duchamp, J. Levant, and C. Marot, "Control of the electromagnetic compatibility: An issue for IC reliability," Microelectronics Reliability, Vol. 51, No. 9-11, 1493-1497, 2011.
doi:10.1109/TEMC.2011.2178098

7. Su, T., M. Unger, T. Steinecke, and R. Weigel, "Degradation of the conducted radio frequency immunity of microcontrollers due to electromagnetic resonances in foot-point loops," IEEE Transactions on Electromagnetic Compatibility, Vol. 54, No. 4, 772-784, 2012.

8. IEC 62132 "Integrated circuits --- Measurement of electromagnetic immunity, 150 kHz to 1 GHz,", IEC Standard, 2006.