1. Ledieu, M. and O. Acher, "Newac hievements in high-frequency permeability measurements of magnetic materials," Journal of Magnetism and Magnetic Materials, 144-150, 2003.
doi:10.1016/S0304-8853(02)01027-2
2. Vincent, D., et al. "A newbroad-band method for magnetic thin- film characterization in the microwave range," IEEE Transactions on Microwave Theory and Techniques, Vol. 53, No. 4, 1174-1180, 2005.
doi:10.1109/TMTT.2005.845730
3. Liu, Y., et al. "Broadband complex permeability characterization of magnetic thin films using shorted microstrip transmissionline perturbation," Review of Scientific Instruments, Vol. 76, 1-063911, 2005.
4. Wang, Y. and M. N. Afsar, "Measurement of complex permittivity of liquids using waveguide techniques," Progress In Electromagnetics Research, Vol. 42, 131-142, 2003.
doi:10.2528/PIER03010602
5. Mahmoud, S. F., "Surface wave character on a slab of metamaterial with negative permittivity and permeability," Progress In Electromagnetics Research, Vol. 51, 127-137, 2005.
doi:10.2528/PIER03102102
6. Baudry, D., A. Louis, and B. Mazari, "Characterization of the open-ended coaxial probe used for near-field measurements in EMC applications," Progress In Electromagnetics Research, Vol. 60, 311-333, 2006.
doi:10.2528/PIER05112501
7. Maricevic, Z. A. and T. K. Sarkar, "Analysis and measurements of arbitrarily shaped open microstrip structures," Progress In Electromagnetics Research, Vol. 15, 253-301, 1997.
doi:10.2528/PIER96012800
8. Vapnik, V., The Nature of Statistical Learning Theory, Springer- Verlag, 1995.
9. Chu, W., C. J. Ong, and S. S. Keerthi, "An improved conjugate gradient scheme to the solution of least squares SVM," IEEE Trans. Neural Network, Vol. 6, No. 2, 498-501, 2005.
doi:10.1109/TNN.2004.841785
10. Shevade, S. K., S. S. Keerthi, C. Bhattacharyya, and K. R. K. Murthy, "Improvements to the SMO algorithm for SVM regression," IEEE Trans. Neural Network, Vol. 11, No. 5, 1188-1193, 2000.
doi:10.1109/72.870050
11. Bermani, E., A. Boni, A., A. Kerhet, and A. Massa, "Kernels evaluation of SVM based-estimators for inverse scattering problems," Progress In Electromagnetics Research, Vol. 53, 167-188, 2005.
doi:10.2528/PIER04090801
12. Tian, B. N., et al. "Researches on transmission/reflection method for material electromagnetic parameters measurements," Chinese Journal of Radio Science, Vol. 16, No. 1, 57-60, 2001.
13. Xia, L., et al. "Modeling of 3D vertical interconnect using support vector machine regression," IEEE Microwave and Wireless Components Letters, Vol. 16, No. 12, 639-641, 2006.
doi:10.1109/LMWC.2006.885585
