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2013-01-18

Covered Image of Superlens

By Yuan Zhang and Michael Anthony Fiddy
Progress In Electromagnetics Research, Vol. 136, 225-238, 2013
doi:10.2528/PIER12121206

Abstract

In this paper, we examine the imaging ability of a planar superlens in both the transverse and vertical dimension. By studying the field patterns of the image from different objects (points and scattering surfaces with subwavelength details) in front of a planar superlens, we show the relation between the transverse and vertical resolutions. We mainly discuss why we cannot get high subwavelength resolution for three dimensions at the same time, and there is a trade-off between the transverse and vertical resolution capabilities which is fundamental in nature for a planar superlens.

Citation


Yuan Zhang and Michael Anthony Fiddy, "Covered Image of Superlens," Progress In Electromagnetics Research, Vol. 136, 225-238, 2013.
doi:10.2528/PIER12121206
http://jpier.org/PIER/pier.php?paper=12121206

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