Vol. 112

Front:[PDF file] Back:[PDF file]
Latest Volume
All Volumes
All Issues
2011-01-06

Retrieval Approach for Determination of Forward and Backward Wave Impedances of Bianisotropic Metamaterials

By Ugur Cem Hasar and Joaquim Jose Barroso
Progress In Electromagnetics Research, Vol. 112, 109-124, 2011
doi:10.2528/PIER10112303

Abstract

A simple approach is proposed for retrieving the forward and backward wave impedances of lossless and lossy bianisotropic metamaterials. Compared with other methods in the literature, its main advantage is that forward and backward wave impedances can be uniquely and noniteratively extracted. It has been validated for both lossless and lossy bianisotropic metamaterials by performing a numerical analysis. The proposed approach can be applied for checking whether the metamaterial structure shows the bianisotropic property by monitoring forward and backward wave impedances, since the forward and backward wave impedances of a metamaterial structure depend on different polarizations of the incident wave.

Citation


Ugur Cem Hasar and Joaquim Jose Barroso, "Retrieval Approach for Determination of Forward and Backward Wave Impedances of Bianisotropic Metamaterials," Progress In Electromagnetics Research, Vol. 112, 109-124, 2011.
doi:10.2528/PIER10112303
http://jpier.org/PIER/pier.php?paper=10112303

References


    1. Chen, L. F., C. K. Ong, C. P. Neo, V. V. Varadan, and V. K. Varadan, Microwave Electronics: Measurement and Materials Characterization, John Wiley & Sons, West Sussex, England, 2004.
    doi:10.1002/0470020466

    2. Nicolson, A. M. and G. Ross, "Measurement of the intrinsic properties of materials by time-domain techniques," IEEE Trans. Instrum. Meas., Vol. 19, No. 4, 377-382, 1970.
    doi:10.1109/TIM.1970.4313932

    3. Weir, W. B., "Automatic measurement of complex dielectric constant and permeability at microwave frequencies," Proc. IEEE, Vol. 62, No. 1, 33-36, 1974.
    doi:10.1109/PROC.1974.9382

    4. Baker-Jarvis, J., E. J. Vanzura, and W. A. Kissick, "Improved technique for determining complex permittivity with the transmission/reflection method," IEEE Trans. Microw. Theory Tech., Vol. 38, No. 8, 1096-1103, 1990.
    doi:10.1109/22.57336

    5. Boughriet, A. H., C. Legrand, and A. Chapoton, "Noniterative stable transmission/reflection method for low-loss material complex permittivity determination," IEEE Trans. Microw. Theory Tech., Vol. 45, No. 1, 52-57, 1997.
    doi:10.1109/22.552032

    6. Chalapat, K., K. Sarvala, J. Li, and G. S. Paraoanu, "Wideband reference-plane invariant method for measuring electromagnetic parameters of materials," IEEE Trans. Microw. Theory Tech., Vol. 57, No. 9, 2267, Sep. 2009.
    doi:10.1109/TMTT.2009.2027160

    7. Zhang, H., S. Y. Tan, and H. S. Tan, "An improved method for microwave nondestructive dielectric measurement of layered media," Progress In Electromagnetics Research B, Vol. 10, 145-161, 2008.
    doi:10.2528/PIERB08082701

    8. Le Floch, J. M., F. Houndonougbo, V. Madrangeas, D. Cros, M. Guilloux-Viry, and W. Peng, "Thin film materials characterization using TE modes," Journal of Electromagnetic Waves and Applications, Vol. 23, No. 4, 549-559, 2009.
    doi:10.1163/156939309787612293

    9. Wu, Y. Q., Z. X. Tang, Y. H. Xu, and B. Zhang, "Measuring complex permeability of ferromagnetic thin films using microstrip transmission method," Journal of Electromagnetic Waves and Applications, Vol. 23, No. 10, 1303-1311, 2009.
    doi:10.1163/156939309789108598

    10. Challa measurement with a non-standard waveguide by using TRL calibration and fractional linear data fitting, R. K., et al., "Permittivity," Progress In Electromagnetics Research B, Vol. 2, 1-13, 2008.

    11. Wu, Y., Z. Tang, Y. Yu, and X. He, "A new method to avoid crowding phenomenon in extracting the permittivity of ferroelectric thin films," Progress In Electromagnetics Research Letters, Vol. 4, 159-166, 2008.
    doi:10.2528/PIERL08091402

    12. He, X., Z. X. Tang, B. Zhang, and Y. Q.Wu, "A new deembedding method in permittivity measurement of ferroelectric thin film material," Progress In Electromagnetics Research Letters, Vol. 3, 1-8, 2008.
    doi:10.2528/PIERL08011501

    13. Hasar, U. C., "Unique retrieval of complex permittivity of low-loss dielectric materials from transmission-only measurements," IEEE Geosi. Remote Sens. Lett., Vol. 8, No. 3, 561-563, 2011.

    14. Hasar, U. C., "Accurate complex permittivity inversion from measurements of a sample partially filling a waveguide aperture," IEEE Trans. Microw. Theory Tech., Vol. 50, No. 2, 451-457, 2010.
    doi:10.1109/TMTT.2009.2038444

    15. Hasar, U. C., "A generalized formulation for permittivity extraction of low-to-high-loss materials from transmission measure ment," IEEE Trans. Microw. Theory Tech., Vol. 58, No. 2, 411-418, 2010.
    doi:10.1109/TMTT.2009.2038443

    16. Hasar, U. C., "A new microwave method for electrical characterization of low-loss materials," IEEE Microw. Wireless Compon. Lett., Vol. 19, No. 12, 801-803, 2009.
    doi:10.1109/LMWC.2009.2033512

    17. Hasar, U. C., "A new calibration-independent method for complex permittivity extraction of solid dielectric materials," IEEE Microw. Wireless Compon. Lett., Vol. 18, No. 12, 788-790, 2008.
    doi:10.1109/LMWC.2008.2007699

    18. Kharkovsky, S. N., M. F. Akay, U. C. Hasar, and C. D. Atis, "Measurement and monitoring of microwave reflection and transmission properties of cement-based specimens," IEEE Trans. Instrum. Meas., Vol. 51, No. 6, 1210-1218, 2002.
    doi:10.1109/TIM.2002.808081

    19. Rodriguez-Vidal, M. and E. Martin, "Contribution to numerical methods for calculation of complex dielectric permittivities," Electron. Lett., Vol. 6, No. 16, 510, 1970.
    doi:10.1049/el:19700354

    20. Ness, J., "Broad-band permittivity measurements using the semi-automatic network analyzer," IEEE Trans. Microw. Theory Tech., Vol. 33, No. 11, 1222-1226, 1985.
    doi:10.1109/TMTT.1985.1133198

    21. Ball, J. A. R. and B. Horsfield, "Resolving ambiguity in broadband waveguide permittivity measurements on moist materials," IEEE Trans. Instrum. Meas., Vol. 47, No. 2, 390-392, 1998.
    doi:10.1109/19.744179

    22. Xia, S., Z. Xu, and X. Wei, "Thickness-induced resonance-based complex permittivity measurement technique for barium strontium titanate ceramics at microwave frequency," Rev. Sci. Instrum., Vol. 80, No. 11, 114703-1-4, 2009.
    doi:10.1063/1.3237244

    23. Hasar, U. C., "Unique permittivity determination of low-loss dielectric materials from transmission measurements at microwave frequencies," Progress In Electromagnetics Research, Vol. 107, 31-46, 2010.
    doi:10.2528/PIER10060805

    24. Buyukozturk, O., T.-Y. Yu, and J. A. Ortega, "A methodology for determining complex permittivity of construction materials based on transmission-only coherent, wide-bandwidth free-space measurements," Cem. Concr. Compos., Vol. 28, 349-359, 2006.
    doi:10.1016/j.cemconcomp.2006.02.004

    25. Varadan, V. V. and R. Ro, "Unique retrieval of complex permittivity and permeability of dispersive materials from reflection and transmitted flelds by enforcing causality," IEEE Trans. Microw. Theory Tech., Vol. 55, No. 10, 2224-2230, Oct. 2007.
    doi:10.1109/TMTT.2007.906473

    26. Ghodgaonkar, D. K., V. V. Varadan, and V. K. Varadan, "A freespace method for measurement of dielectric constants and loss tangents at microwave frequencies," IEEE Trans. Instrum. Meas., Vol. 38, No. 3, 783-793, Jun. 1989.
    doi:10.1109/19.32194

    27. Hasar, U. C., "A fast and accurate amplitude-only transmission-reflection method for complex permittivity determination of lossy materials," IEEE Trans. Microw. Theory Tech., Vol. 56, No. 9, 2129-2135, Sep. 2008.
    doi:10.1109/TMTT.2008.2002229

    28. Hasar , U. C. and O. Simsek, "An accurate complex permittivity method for thin dielectric materials," Progress In Electromagnetics Research, Vol. 91, 123-138, 2009.
    doi:10.2528/PIER09011702

    29. Hasar, U. C. and C. R. Westgate, "A broadband and stable method for unique complex permittivity determination of low-loss materials," IEEE Trans. Microw. Theory Tech., Vol. 57, No. 2, 471-477, Feb. 2009.
    doi:10.1109/TMTT.2008.2011242

    30. Hasar, U. C., "A new microwave method based on transmission scattering parameter measurements for simultaneous broadband and stable permittivity and permeability determination," Progress In Electromagnetics Research, Vol. 93, 161-176, 2009.
    doi:10.2528/PIER09041405

    31. Barroso, J. J. and A. L. de Paula, "Retrieval of permittivity and permeability of homogeneous materials from scattering parameters," Journal of Electromagnetic Waves and Applications, Vol. 24, No. 11--12, 1563-1574, Aug. 2010.
    doi:10.1163/156939310792149759

    32. Hasar, U. C. and E. A. Oral, "A metric function for fast and accurate permittivity determination of low-to-high-loss materials from reflection measurements," Progress In Electromagnetics Research, Vol. 107, 397-412, 2010.
    doi:10.2528/PIER10071308

    33. Hasar, U. C., "Procedure for accurate and stable constitutive parameters extraction of materials at microwave frequencies," Progress In Electromagnetics Research, Vol. 109, 107-121, 2010.
    doi:10.2528/PIER10083006

    34. Hasar, U. C., "A microwave method for accurate and stable retrieval of constitutive parameters of low- and medium-loss materials," IEEE Microw. Wireless Compon. Lett., Vol. 20, Dec. 2010.

    35. Hasar, U. C., "A microwave method for noniterative constitutive parameters determination of thin low-loss or lossy materials," IEEE Trans. Microw. Theory Tech., Vol. 57, 1595-1601, Jun. 2009.
    doi:10.1109/TMTT.2009.2020779

    36. Hasar, U. C., C. R. Westgate, and M. Ertugrul, "Noniterative permittivity extraction of lossy liquid materials from reflection asymmetric amplitude-only microwave measurements," IEEE Microw. Wireless Compon. Lett., Vol. 19, No. 6, 419-421, Jun. 2009.
    doi:10.1109/LMWC.2009.2020045

    37. Hasar, U. C., "Thickness-independent automated constitutive parameters extraction of thin solid and liquid materials from waveguide measurements," Progress In Electromagnetics Research, Vol. 92, 17-32, 2009.
    doi:10.2528/PIER09031606

    38. Veselago, V. G., "The electrodynamics of substances with simultaneously negative values of ε and μ," Sov. Phys. USPEKHI,, Vol. 10, No. 4, 509-514, Jan.--eb. 1968.
    doi:10.1070/PU1968v010n04ABEH003699

    39. Li, Z., K. Aydin, and E. Ozbay, "Determination of the effective constitutive parameters of bianisotropic metamaterials from reflection and transmission coefficients," Phys. Rev. E, Vol. 79-7, 2009.

    40. Barroso, J. J., P. J. Castro, and J. P. Leite Neto, "Experiments on wave propagation at 6.0 GHz in a left-handed waveguide," Microw. Opt. Technol. Lett., Vol. 52, No. 10, 2175-2178, Oct. 2010.
    doi:10.1002/mop.25435

    41. Pendry, J. B., A. J. Holden, W. J. Stewart, and I. Youngs, "Extremely low frequency plasmons in metallic mesostructures," Phys. Rev. Lett., Vol. 76, No. 25, 4773-4776, Jun. 1996.
    doi:10.1103/PhysRevLett.76.4773

    42. Pendry, J. B., A. J. Holden, D. J. Robbins, and W. J. Stewart, "Low frequency plasmons in thin-wire structures," J. Phys.: Condens. Matter, Vol. 10, No. 22, 4785-4809.
    doi:10.1088/0953-8984/10/22/007

    43. Pendry, J. B., A. J. Hold, D. J. Robbins, and W. J. Stewart, "Magnetism from conductors and enhanced nonlinear phenomena," IEEE Trans. Microw. Theory Tech., Vol. 47, No. 11, 2075-2084, Nov. 1999.
    doi:10.1109/22.798002

    44. Smith, D. R., S. Schultz, P. Markos, and C. M. Soukoulis, "Determination of effective permittivity and permeability of metamaterials from reflection and transmission coefficients," Phys. Rev. B, Vol. 65, 195104-1-5, 2002.

    45. Notomi, M., "Theory of light propagation in strongly modulated photonic crystals: Refractionlike behavior in the vicinity of the photonic band gap," Phys. Rev. B, Vol. 62, No. 16, 10696-10705, Oct. 2000.
    doi:10.1103/PhysRevB.62.10696

    46. Smith, D. R., D. C. Vier, T. Koschhy, and C. M. Soukoulis, "Electromagnetic parameter retrieval from inhomogeneous metamaterials," Phys. Rev. E, Vol. 71, No. 3, 036617-1-11, 2005.

    47. Marques, R., F. Medina, and R. Rafii-El-Idrissi, "Role of bianisotropy in negative permeability and left-handed metamaterials," Phys. Rev. B, Vol. 65, No. 14, 144440-1-6, Apr. 2002.
    doi:10.1103/PhysRevB.65.144440

    48. Katsarakis, N., T. Koschny, M. Kafesaki, E. N. Economou, and C. M. Soukoulis, "Electric coupling to the magnetic resonance of split ring resonators," Appl. Phys. Lett., Vol. 84, No. 15, 2943-2945, Apr. 2004.
    doi:10.1063/1.1695439

    49. Markos, P. and C. M. Soukoulis, "Transmission properties and effective electromagnetic parameters of double negative metamaterials," Opt. Express, Vol. 11, No. 7, 649-661, Apr. 2003.
    doi:10.1364/OE.11.000649

    50. Ziolkowski, R. W., "Design, fabrication, and testing of double negative metamaterials," IEEE Trans. Antennas Propag., Vol. 51, No. 7, 1516-1529, Jul. 2003.
    doi:10.1109/TAP.2003.813622

    51. Chen, X., T. M. Gregorczyk, B.-I. Wu, J. Pacheco, Jr., and J. A. Kong, "Robust method to retrieve the constitutive effective parameters of metamaterials," Phys. Rev. E, Vol. 70, 016608-1-7, 2004.

    52. Grzegorczyk, T. M., X. Chen, J. Pacheco, J. Chen, B.-I. Wu, and J. A. Kong, "Reflection coefficients and Goos-Hanchen shifts in anisotropic and bianisotropic left-handed metamaterials," Progress In Electromagnetics Research, Vol. 51, 83-113, 2005.
    doi:10.2528/PIER04040901

    53. Chen, X., T. M. Grzegorczyk, and J. A. Kong, "Optimization approach to the retrieval of the constitutive parameters of a slab of general bianisotropic medium," Progress In Electromagnetics Research, Vol. 60, 1-18, 2006.
    doi:10.2528/PIER05120601

    54. Chen, X., B.-I. Wu, J. A. Kong, and T. M. Grzegorczyk, "Retrieval of the effective constitutive parameters of bianisotropic metamaterials," Phys. Rev. E, Vol. 71, 046610-1-9, 2005.

    55. Constantine, A. B., Advanced Engineering Electromagnetics, John Wiley & Sons, 1989.