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2024-08-28
Deviation Analysis of Multiport VNA Hardware Specification-Related Nonideality
By
Progress In Electromagnetics Research Letters, Vol. 122, 75-80, 2024
Abstract
In this paper, the deviation generated by actual multiport vector network analyzer (MVNA) hardware specification is derived. Based on the error flowchart of the n-port VNA, the generalized matrix expression of the raw scattering parameters for each error term is solved by introducing the generalized node method. Combined with incremental method, the generalized matrix expression of the final relative scattering parameter measurement deviation is calculated after ignoring the infinitesimals above the second order. Thus, the method of variable controlling is applied to make difference so that the deviation associated with every error term can be obtained. The validness and effectiveness of this method are verified by utilizing Agilent N5230C to measure a 20 dB direction coupler. The data is processed with an algorithm in MATLAB.
Citation
Nan Sun, Liang Ren, Zhi-Tao Yang, Ming Shen, and Hong-Wei Deng, "Deviation Analysis of Multiport VNA Hardware Specification-Related Nonideality," Progress In Electromagnetics Research Letters, Vol. 122, 75-80, 2024.
doi:10.2528/PIERL23102104
References

1. Hackborn, R., "An automatic network analyzer system," Microw. Journal, Vol. 11, 45-52, May 1968.

2. Stumper, Ulrich, "Influence of tmso calibration standards uncertainties on VNA S-parameter measurements," IEEE Transactions on Instrumentation and Measurement, Vol. 52, No. 2, 311-315, 2003.

3. Stumper, Ulrich, "Uncertainty of VNA S-parameter measurement due to non-ideal TMSO or LMSO calibration standards," Advances in Radio Science, Vol. 1, 1-8, 2003.

4. Stumper, Ulrich, "Influence of nonideal calibration items on S-parameter uncertainties applying the SOLR calibration method," IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 4, 1158-1163, 2008.

5. Wang, Min, Yongjiu Zhao, Tian Hong Loh, Qian Xu, and Yonggang Zhou, "Efficient uncertainty evaluation of vector network analyser measurements using two-tier bayesian analysis and monte carlo method," Proc. IET Conf., 1-5, 2018.

6. Stumper, Ulrich, "Uncertainties of VNA S-parameter measurements applying the short-open-load-reciprocal (SOLR) calibration method," 2008 Conference on Precision Electromagnetic Measurements Digest, 438-439, 2008.

7. Leinhos, J. and U. Arz, "Monte-Carlo analysis of measurement uncertainties for on-wafer thru-reflect-line calibrations," 2008 71st ARFTG Microwave Measurement Conference, 1-4, 2008.

8. Zhao, Wei, Xiaodong Yang, Jiankang Xiao, Qammer H. Abbasi, Hongbo Qin, and Huorong Ren, "Uncertainties of multiport VNA S-parameter measurements applying the GSOLT calibration method," IEEE Transactions on Instrumentation and Measurement, Vol. 61, No. 12, 3251-3258, 2012.

9. Kruppa, W. and K. F. Sodomsky, "An explicit solution for the scattering parameters of a linear two-port measured with an imperfect test set," IEEE Transactions on Microwave Theory and Techniques, Vol. 19, No. 1, 122-123, 1971.

10. Lenk, Friedrich, Ralf Doerner, and Andrej Rumiantsev, "Sensitivity analysis of S-parameter measurements due to calibration standards uncertainty," IEEE Transactions on Microwave Theory and Techniques, Vol. 61, No. 10, 3800-3807, 2013.

11. Stumper, Ulrich, "Uncertainties of VNA S-parameter measurements applying the tan self-calibration method," IEEE Transactions on Instrumentation and Measurement, Vol. 56, No. 2, 597-600, 2007.

12. Ouameur, Mohamed, F. Ziade and Y. Le Bihan, "Novel broadband calibration method of current shunts based on VNA," IEEE Trans. Instrum. and Meas., Vol. 68, No. 3, 854-863, March 2019.
doi:10.1109/TIM.2018.2855499

13. Mubarak, F. A., R. Romano, G. Rietveld, and M. Spirito, "A novel calibration method for active interferometer-based VNAs," IEEE Microwave and Wireless Components Letters, Vol. 30, No. 8, 829-832, 2020.

14. Stumper, Ulrich and Thorsten Schrader, "Influence of different configurations of nonideal calibration standards on vector network analyzer performance," IEEE Transactions on Instrumentation and Measurement, Vol. 61, No. 7, 2034-2041, 2012.

15. Sanpietro, F., A. Ferrero, U. Pisani, and L. Brunetti, "Accuracy of a multiport network analyzer," Conference on Precision Electromagnetic Measurements, Vol. 44, No. 2, 304-307, Apr. 1995.

16. Heuermann, H., "GSOLT: The calibration procedure for all multi-port vector network analyzers," IEEE MTT-S International Microwave Symposium Digest, 1815-1818, Philadelphia, PA, USA, 2003.

17. Ferrero, Andrea, Marco Garelli, Brett Grossman, Susan Choon, and Valeria Teppati, "Uncertainty in multiport S-parameters measurements," 77th ARFTG Microwave Measurement Conference, 1-4, 2011.