volume | PIER Journals

2018-07-12

Complex Permittivity Estimation for Each Layer in a BI-Layer Dielectric Material at Ku-Band Frequencies

Lahcen Ait Benali,

Dr. Lahcen Ait Benali

INPT

Morocco

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Abdelwahed Tribak,

Professor Abdelwahed Tribak

National Institute of Posts and Telecommunications (INPT)

Morocco

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Jaouad Terhzaz,

Prof. Jaouad Terhzaz

Centre Régional des Métiers de L’éducation et de Formation (CRMEF)

Morocco

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Angel Mediavilla Sanchez

Dr. Angel Mediavilla Sanchez

Dept. of Communication Engineering

University of Cantabria

Spain

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Progress In Electromagnetics Research M, Vol. 70, 109-116, 2018

doi:10.2528/PIERM18010813

Abstract

In this paper, a new measurement method is proposed to estimate the complex permittivity for each layer in a bi-layer dielectric material using a Ku-band rectangular waveguide WR62. The S_ij-parameters at the reference planes in the rectangular waveguide loaded by a bi-layer material sample are measured as a function of frequency using the E8634A Network Analyzer. Also, by applying the transmission lines theory, the expressions for these parameters as a function of complex permittivity of each layer are calculated. The Nelder-Mead algorithm is then used to estimate the complex permittivity of each layer by matching the measured and calculated the S_ij-parameters. This method has been validated by estimating, at the Ku-band, the complex permittivity of each layer of three bi-layer dielectric materials. A comparison of estimated values of the complex permittivity obtained from bi-layer measurements and mono-layer measurements is presented.

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Lahcen Ait Benali, Abdelwahed Tribak, Jaouad Terhzaz, and Angel Mediavilla Sanchez, "Complex Permittivity Estimation for Each Layer in a BI-Layer Dielectric Material at Ku-Band Frequencies," Progress In Electromagnetics Research M, Vol. 70, 109-116, 2018.
doi:10.2528/PIERM18010813

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