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PIER PIER B PIER C PIER M PIER Letters
2009-03-09
An Accurate Complex Permittivity Method for Thin Dielectric Materials
By
Ugur Cem Hasar,

    Prof. Ugur Cem Hasar

    Electrical and Electronics Engineering

    Gaziantep University

    Turkey

    Homepage

O. Simsek

    Dr. O. Simsek

    Department of Physics

    Ataturk University

    Turkey

    Homepage

Progress In Electromagnetics Research, Vol. 91, 123-138, 2009
doi:10.2528/PIER09011702
Abstract
A promising microwave method has been proposed to accurately determine the complex permittivity of thin materials. The method uses amplitude-only scattering parameter measurements at one frequency for this purpose. It resolves the problems arising from any offset of the sample inside its cell in complex reflection scattering parameter measurements and from any uncertainty in sample thickness in transmission scattering parameter measurements. The method determines unique permittivity since, for thin samples, multi-valued trigonometric terms can be linearized. It uses higher order approximations to extract highly accurate permittivity values. It works very well in limited frequency-band applications or for dispersive materials since it is based upon point-bypoint or (frequency-by-frequency) measurements. For validation of the method, we measured the complex permittivity of two thin polytetrafluoro-ethylene (PTFE) samples.
Citation
Ugur Cem Hasar, and O. Simsek, "An Accurate Complex Permittivity Method for Thin Dielectric Materials," Progress In Electromagnetics Research, Vol. 91, 123-138, 2009.
doi:10.2528/PIER09011702
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