volume | PIER Journals

2008-01-03

Finite Element Method Simulation of Photoinductive Imaging for Cracks

Cheng-Chi Tai,

Prof. Cheng-Chi Tai

Department of Electrical Engineering

National Cheng Kung University

Taiwan

Homepage

Yen-Lin Pan

Dr. Yen-Lin Pan

Department of Electrical Engineering

National Cheng Kung University

Taiwan

Homepage

, Vol. 2, 53-61, 2008

doi:10.2528/PIERL07122807

Abstract

In this paper, the numerical simulations of photoinductive imaging (PI) method have been performed using the finite element method (FEM) with the 2D transient to characterize corner cracks at the edge of a bolt hole. The PI imaging results have higher spatial resolution in the area of the defect in 2D models as compared with the conventional eddy current (EC) images. The FEM simulation results of 0.5-mm rectangular defects are showed and analyzed. The dependencies of PI signals on EC frequencies and temperature of the thermal spot are also examined. The results demonstrate that the PI method is applicable to examine the geometric shape of corner cracks.

Citation

Copy Export

Cheng-Chi Tai, and Yen-Lin Pan, "Finite Element Method Simulation of Photoinductive Imaging for Cracks," , Vol. 2, 53-61, 2008.
doi:10.2528/PIERL07122807

References

1. Moulder, J. C., N. Nakagawa, K. S. No, Y. P. Lee, and J. F. McClelland, "Photoinductive imaging: a new NDE technique," Review of Progress in Quantitative NDE, D. O. Thompson and D. E. Chimenti (eds.), Vol. 8A, 599, Plenum Press, New York, 1989.

2. Moulder, J. C. and N. Nakagawa, "Characterizing the performance of eddy current probes using photoinductive field-mapping," Research in Nondestructive Evaluation, Vol. 4, 221-236, 1992.

3. Hughes, M. S., J. C. Moulder, M. W. Kubovich, and B. A. Auld, "“Mapping eddy current probe fields using the photoinductive effect," NDT & E International, Vol. 28, 251, 1995.

4. Nakagawa, N. and J. C. Moulder, "Eddy current probe calibration via the photoinductive effect," NDT and E International, Vol. 28, 245-246, 1995.

5. Tai, C.-C. and J. C. Moulder, "Bolt-hole corner crack inspection using the photoinductive imaging method," Journal of Nondestructive Evaluation, Vol. 19, 81-93, 2000.
doi:10.1023/A:1026505625735

6. Auld, B. A., S. R. Jefferies, and J. C. Moulder, "Eddy-current signal analysis and inversion for semielliptical surface cracks," Journal of Nondestructive Evaluation, Vol. 7, 79-94, 1988.
doi:10.1007/BF00565779