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PIER PIER B PIER C PIER M PIER Letters
2020-03-15
One-Antenna Radiation Pattern Measurement of on-Wafer Antennas in Probe Station Environment
By
Jianfang Zheng,

    Dr. Jianfang Zheng

    Aalto University

    Finland

    Homepage

Juha Ala-Laurinaho,

    Dr. Juha Ala-Laurinaho

    Aalto University

    Finland

    Homepage

Zachary D. Taylor,

    Dr. Zachary D. Taylor

    Department of Electronics and Nanoengineering and MilliLab, School of Electrical Engineering

    Aalto University

    Finland

    Homepage

Antti V. Räisänen

    Prof. Antti V. Räisänen

    TKK Helsinki University of Technology

    Finland

    Homepage

Progress In Electromagnetics Research, Vol. 167, 31-39, 2020
doi:10.2528/PIER19121807
Abstract
We propose and demonstrate the use of radiation pattern measurement method for on-wafer antennas for the first time that is capable of in-depth antenna characterization with limited equipment. This one-antenna method extracts gain without the need for a second antenna in the on-wafer probe station environment. A combination of reference reflector translation and rotation allows radiation pattern sampling at multiple angles enabling characterization over the relevant solid angle. Several microstrip patch antennas with varying beam directions (0˚, 20˚, and 30˚) were measured with the proposed method over 120˚ in the H-plane with good agreement between simulation and experiment. The method offers a cost-effective and time-efficient solution for probe-fed, on-wafer antenna radiation performance characterization.
Citation
Jianfang Zheng, Juha Ala-Laurinaho, Zachary D. Taylor, and Antti V. Räisänen, "One-Antenna Radiation Pattern Measurement of on-Wafer Antennas in Probe Station Environment," Progress In Electromagnetics Research, Vol. 167, 31-39, 2020.
doi:10.2528/PIER19121807
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