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PIER PIER B PIER C PIER M PIER Letters
2023-09-25
Polarization-Wavelength Locked Plasmonic Topological States
By
Yuan-Zhen Li,

    Mr. Yuan-Zhen Li

    State Key Laboratory of Modern Optical Instrumentation, and The Electromagnetics Academy at Zhejiang University

    Zhejiang University

    China

    Homepage

Zijian Zhang,

    Dr. Zijian Zhang

    ZJU-Hangzhou Global Scientific and Technological Innovation Center

    Zhejiang University

    China

    Homepage

Hongsheng Chen,

    Professor Hongsheng Chen

    The Electromagnetics Academy at Zhejiang Unviersity

    Zhejiang University

    China

    Homepage

Fei Gao

    Prof. Fei Gao

    College of Information Science and Electronic Engineering

    Zhejiang University

    China

    Homepage

Progress In Electromagnetics Research, Vol. 178, 37-47, 2023
doi:10.2528/PIER23081008
Abstract
Plasmonic topological states, providing a new way to bypass the diffraction limits and against fabrication disorders, have attracted intense attention. In addition to the near-field coupling and band topology, the localized surface plasmonic resonance modes can be manipulated with far-field degrees of freedom (DoFs), such as polarization. However, changing the frequency of the topological edge states with different polarized incident waves remains a challenge, which has led to significant interest in multiplexed radiative topological devices. Here, we report the realization of polarization-wavelength locked plasmonic topological edge states on the Su-Schrieffer-Heeger (SSH) model. We theoretically and numerically show that such phenomenon is based on two mechanisms, i.e., the splitting in the spectra of plasmonic topological edge states with different intrinsic parity DoF and projecting the far-field polarizations to the parity of lattice modes. These results promise applications in robust optical emitters and multiplexed photonic devices.
Citation
Yuan-Zhen Li, Zijian Zhang, Hongsheng Chen, and Fei Gao, "Polarization-Wavelength Locked Plasmonic Topological States," Progress In Electromagnetics Research, Vol. 178, 37-47, 2023.
doi:10.2528/PIER23081008
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