Vol. 30

Front:[PDF file] Back:[PDF file]
Latest Volume
All Volumes
All Issues

Spectro-Temporal Mismatch Analysis of a Transmission Line Based on on-Wafer Optical Sampling

By Dong-Joon Lee, Jae-Yong Kwon, and Joo-Gwang Lee
Progress In Electromagnetics Research Letters, Vol. 30, 153-162, 2012


We present an optical sampling technique that enables exploration of mismatches of a microstrip transmission line based on reflection analyses of electromagnetic pulses. The external electro-optic sampling scheme with a minute crystal detects high-speed electrical pulses over arbitrary locations of a line with very low-intrusiveness. The temporal pulsed signals measured with an on-wafer optical probing system and the corresponding spectra are obtained to analyze the transfer characteristics of a microstrip transmission line with 20 GHz bandwidth. The spectro-temporal response was cross-checked with commercial instruments. Applications of this optical probing technique to explore mismatches at the terminal port - based on both time and frequency domain reflectometry analyses - are also presented.


Dong-Joon Lee, Jae-Yong Kwon, and Joo-Gwang Lee, "Spectro-Temporal Mismatch Analysis of a Transmission Line Based on on-Wafer Optical Sampling," Progress In Electromagnetics Research Letters, Vol. 30, 153-162, 2012.


    1. Agilent Technologies, Time domain analysis using a network analyzer, Application Note 1287-12, 2011.

    2. Agilent Technologies, De-embedding and embedding S-parameter networks using a vector network analyzer, Application Note 1364-1, 2009.

    3. Valdmanis, J. A. and G. A. Mourou, "Subpicosecond electrooptic sampling: Principles and applications," IEEE Journal of Quantum Electronics, Vol. 22, No. 1, 69-78, 1986.

    4. Frankel, M., J. F. Whitaker, G. A. Morou, and J. A. Valdmanis, "Ultrahigh bandwidth vector analyzer based on external electro-optic sampling," Solid State Electronics, Vol. 35, No. 2, 325-332, 1992.

    5. Seitz, S., M. Bieler, M. Spitzer, K. Pierz, G. Hein, and U. Siegner, "Optoelectronic measurement of the transfer function and time response of a 70 GHz sampling oscilloscope," Measurement Science and Technology, Vol. 16, No. 10, L7-L9, 2005.

    6. Williams, D. F., P. D. Hale, T. S. Clement, and J. M. Morgan, "Calibrated 200-GHz waveform measurement," IEEE Trans. on Microwave Theory and Tech., Vol. 53, No. 4, 1384-1388, 2005.

    7. Bieler, M., S. Seitz, M. Spitzer, G. Hein, K. Pierz, U. Siegner, M. A. Basu, A. J. A. Smith, and M. R. Harper, "Rise-time calibration of 50-GHz sampling oscilloscopes: Intercomparison between PTB and NPL," IEEE Trans. on Instrum. Meas., Vol. 56, No. 2, 266-270, 2007.

    8. Ma, Z., H. Ma, P. Gong, C. Yang, and K. Feng, "Ultrafast optoelectronic technology for radio metrology applications," Journal of Systems Engineering and Electronics, Vol. 21, No. 3, 461-468, 2010.

    9. Lee, D. J. and J. F. Whitaker, "A simplified fabry-Pérot electro-optic modulation sensor," IEEE Phot. Tech. Lett., Vol. 20, No. 10, 866-868, 2008.