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2009-06-04

The Study of Structure-Dependent Properties of Thin Magnetic Films at Microwaves by Field-Domain Resonance Technique

By Sergey Nickolaevich Starostenko and Konstantin Rozanov
Progress In Electromagnetics Research C, Vol. 8, 43-55, 2009
doi:10.2528/PIERC09042804

Abstract

The strip-line frequency-domain technique for permeability measurement is compared to the field domain technique. The combined setup for microwave measurement of thin film permeability with both techniques is proposed. The field-domain technique is less affected by inhomogeneity of measurement strip cell and has significantly higher signal-to-noise ratio, but the obtained parameters are affected by film thickness and may differ from that of the frequency-domain technique. Analysis of the field-domain data obtained at a set of frequencies makes it possible to determine the saturation magnetisation, the anisotropy field and the damping factor without the knowledge of the amount of substance under study. In case of a simple permeability spectrum the data on metal thickness make it possible to estimate the effective skin-depth as well. The technique is tested by simulation and is applied to determine permeability of Fe-based films vacuum-sputtered on glassceramic and polymer substrates.

Citation


Sergey Nickolaevich Starostenko and Konstantin Rozanov, "The Study of Structure-Dependent Properties of Thin Magnetic Films at Microwaves by Field-Domain Resonance Technique," Progress In Electromagnetics Research C, Vol. 8, 43-55, 2009.
doi:10.2528/PIERC09042804
http://jpier.org/PIERC/pier.php?paper=09042804

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