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2008-10-30

Dielectric Permittivity Measuring Technique of Film-Shaped Materials at Low Microwave Frequencies from Open-End Coplanar Waveguide

By Juan Hinojosa
Progress In Electromagnetics Research C, Vol. 5, 57-70, 2008

Abstract

This paper presents a broad-band technique for measuring the dielectric permittivity of isotropic nonmagnetic film-shaped materials at low microwave frequencies. The material under test is the substrate of an open-end coplanar waveguide (CPW) used as sample-cell. The dielectric permittivity is extracted from S11 reflection parameter measurement of the open-end CPW cell using analytical relationships, which allow to decrease the computation time with respect to any full-wave electromagnetic method. Vector network analyzer (VNA) and high-quality on-coplanar test fixture are used for the measurements between 300 kHz and 3 GHz. Measured εr data for several nonmagnetic low-loss materials are presented. This technique shows a good agreement between measured and predicted data for the real permittivity over 0.05 GHz-3GHz frequency range.

Citation


Juan Hinojosa, "Dielectric Permittivity Measuring Technique of Film-Shaped Materials at Low Microwave Frequencies from Open-End Coplanar Waveguide," Progress In Electromagnetics Research C, Vol. 5, 57-70, 2008.
http://jpier.org/PIERC/pier.php?paper=08100101

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