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Characterization of the Open-Ended Coaxial Probe Used for Near-Field Measurements in EMC Applications

By David Baudry, A. Louis, and B. Mazari
Progress In Electromagnetics Research, Vol. 60, 311-333, 2006


A completely automatically near-field mapping system is developed within IRSEEM (Research Institute for Electronic Embedded Systems) in order to determine electromagnetic field radiated by electronic systems. This test bench uses a 3D positioning system of the probe to make accurate measurements. The main element of this measurement tool is the probe. This paper presents a characterization of the open-ended coaxial probe which is used to measure the normal component of the electric field.


 (See works that cites this article)
David Baudry, A. Louis, and B. Mazari, "Characterization of the Open-Ended Coaxial Probe Used for Near-Field Measurements in EMC Applications," Progress In Electromagnetics Research, Vol. 60, 311-333, 2006.


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