1. Sakurai, T., S. Mochizuki, and M. Ishigame, "Measurement of electrical conductivity of oxides at high temperatures by microwave ellipsometry," High-temp.-High Press., Vol. 7, 411-417, 1975.
2. Hertl, S., G. Schaffar, and H. Storl, "Contactless determination of the properties of water films on roads," J. Phys. E (Sci. Instrum.), Vol. 21, 955-958, 1988.
doi:10.1088/0022-3735/21/10/010
3. Sagnard, F., F. Bentabet, and C. Vignat, "Theoretical study of method based on ellipsometry for measurement of complex permittivity of materials," Electronics Letters, Vol. 36, 1843-1845, 2000.
doi:10.1049/el:20001313
4. Tsuzkiyama, K., T. Sakai, T. Yamazaki, and O. Hashimoto, "Ellipsometry for measurement of complex dielectric permittivity in millimeter-wave region ," Conf. Proc. 33rd European Microwave Conference, 487-490, 2003.
doi:10.1109/EUMA.2003.340996
5. Mochizuki, S. and T. Sakurai, "Electrical conduction of MgO doped with CR at high temperatures in oxidizing atmosphere," Phys. Stat. Sol., Vol. 41, 411-415, 1977.
doi:10.1002/pssa.2210410208
6. Van Vliet, A. H. F. and T. de Graauw, "Quarter wave plates for submillimeter wavelengths," Int. J. Infrared and Millimeter Waves, Vol. 2, 465-476, 1981.
doi:10.1007/BF01007414
7. Hecht, E. and A. Zajac, "Optics," Addison-Wesley, Reading Mass., 1974.